This page contains those books on various branches of materials science and engineering which I will read in the future.
Reimer, L. (1993). Image formation in low-voltage scanning electron microscopy (Vol. 12). SPIE press.
I read this book between 18.1.2019 and 29.1.2019. Taking into the account the days I did not actually read it, my reading rate was 12 pg./day. The book is well-organized and informative. It is limited, however, to certain references. This is the only book on the topic and cannot be the last one. I extracted some bunches of notes from the text and the following information looking at the references while reading: 1) conferences and scientific societies, 2) books and journal names, and 3) reference for further reading. I will go through this references in the next week.
Reimer, L. (2013). Scanning electron microscopy: physics of image formation and microanalysis (Vol. 45). Springer.
Reimer, L., & Microscopy, S. E. (1984). Physics of image formation and microanalysis. Springer Ser. in Optical Sciences, 45, 2.
Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W., Scott, J. H. J., & Joy, D. C. (2017). Scanning electron microscopy and X-ray microanalysis. Springer.
Egerton, R. F. (2011). Electron energy-loss spectroscopy in the electron microscope. Springer Science & Business Media.
Colthup, N., Daly, L. H., Wiberley, S. E. (2012). Introduction to infrared and Raman spectroscopy. Elsevier.
Mechanical Properties and Deformation
Electron Microscopy
Reimer, L. (1993). Image formation in low-voltage scanning electron microscopy (Vol. 12). SPIE press.
I read this book between 18.1.2019 and 29.1.2019. Taking into the account the days I did not actually read it, my reading rate was 12 pg./day. The book is well-organized and informative. It is limited, however, to certain references. This is the only book on the topic and cannot be the last one. I extracted some bunches of notes from the text and the following information looking at the references while reading: 1) conferences and scientific societies, 2) books and journal names, and 3) reference for further reading. I will go through this references in the next week.
Reimer, L. (2013). Scanning electron microscopy: physics of image formation and microanalysis (Vol. 45). Springer.
Reimer, L., & Microscopy, S. E. (1984). Physics of image formation and microanalysis. Springer Ser. in Optical Sciences, 45, 2.
Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W., Scott, J. H. J., & Joy, D. C. (2017). Scanning electron microscopy and X-ray microanalysis. Springer.
SU-IC: QC 4544 .E4 E34 1996
Vibrational Spectroscopy